Translator Disclaimer
11 March 1994 Three-dimensional measurement system using a CCD sensor and a laser scanner
Author Affiliations +
Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171214
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
A new active mode technique for the measurement of 3D objects was developed using a CCD line sensor and a galvanomirror scanner. The CCD line sensor is placed in parallel to the laser light scanning plane. When a series of equally spaced laser light spots is projected on to a surface, the spot density on the surface is altered depending on the shape of the surface. By measuring the displacement of a light spot the distance between the camera and the object can be determined using trigonometry. During the measurements, laser light was vertically scanned and object was horizontally moved. The measurement error for an object of 1 m apart from the camera is 0.08 percent in scanning direction and 0.2 percent in object-height direction. A modified experiment also was performed for the purpose of shape recognition of a given object. The success of this experiment is demonstrated by using objects of rectangular, triangular and round shapes.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshinori Hatanaka, Yasushi Kobayashi, and Hidetoshi Takahashi "Three-dimensional measurement system using a CCD sensor and a laser scanner", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171214
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Novel microarray scanner
Proceedings of SPIE (September 11 2002)
Scanner show-through reduction using reflective optics
Proceedings of SPIE (December 17 2003)
A palm top camera for 3D profilometry incorporating a MEMS...
Proceedings of SPIE (November 11 2010)

Back to Top