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1 May 1994 Phase-strain model for polarimetric strain sensors based on fictitious residual strains
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Abstract
The development of a phenomenologically based phase-strain model for structurally embedded polarimetric sensors is presented and then applied to Bow-Tie and e-core high-birefringence optical fibers and a standard circular core low-birefringence optical fiber. This phase-strain model is developed by postulating the existence of a fictitious residual strain state in the optical fiber core, and then following standard model development techniques. Calibration procedures are used to determine all parameters required by this model.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu-Lung Lo, Peter Louring Nielsen, and James S. Sirkis "Phase-strain model for polarimetric strain sensors based on fictitious residual strains", Proc. SPIE 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation, (1 May 1994); https://doi.org/10.1117/12.173978
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