Paper
16 May 1994 Correlation between the sensitivity and the contrast of polymer resists for developing in good and bad solvents
Vladimir N. Genkin, M. Yu. Myl'nikov
Author Affiliations +
Abstract
The development processes in microlithography consist in removing of exposure region with rate V exceeding the dissolution rate of unexposed regions. The technology characteristics of the resists are the contrast, the sensitivity and the resolution. These characteristics depend on the resist response to the irritation and on the development conditions. We want to devote this work to the analysis of correlation between the resolution, the contrast, the sensitivity determined by the indicated method and the exposure dose for homogeneous irradiation.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir N. Genkin and M. Yu. Myl'nikov "Correlation between the sensitivity and the contrast of polymer resists for developing in good and bad solvents", Proc. SPIE 2195, Advances in Resist Technology and Processing XI, (16 May 1994); https://doi.org/10.1117/12.175387
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polymers

Macromolecules

Diffusion

Molecules

Solids

Thermodynamics

Optical lithography

Back to Top