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1 June 1994 Breadboard phase of the XMM optical monitor
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Abstract
A multi-national consortium of research groups are developing the XMM (x-ray multi-mirror mission) optical monitor to provide a capability for optical identification and photometry of x-ray sources observed by the XMM observatory. This will be the first multi-wavelength facility dedicated to monitoring the variability of diverse sources from the optical through to x-ray wavelengths. Here we describe the system design and discuss progress in the breadboard phase of the development program.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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