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1 March 1995 Modeling of selected metrological properties of laser diodes based on experimental research
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Abstract
In this paper the authors present the results of the research that has been carried out hitherto in selected parameters of laser diode. Statistical equation of slotted line processing was defined as well as empirical ratios of the equation, which is useful to analyze metrological properties of the semiconductor laser. The above workings tend to examine the reliability of semiconductor laser processing of current input on optical radiation.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Danuta Turzenieka and Przemyslaw Otomanski "Modeling of selected metrological properties of laser diodes based on experimental research", Proc. SPIE 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing, (1 March 1995); https://doi.org/10.1117/12.203747
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