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Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns
Temperature dependence of refractive index as a basis for laser thermometry of semiconductor crystals
Measurement of temperature dependencies of real and imaginary parts of the complex index of refraction of monocrystalline of silicon in the range of absorption edge
Modeling of light transmission in a fiber optic path of any shape for refractometric sensors with intensity modulation
Fourier analysis as a means of contemporary measurements of several quantities influencing the refractive index of intensity-based fiber sensors
Measurement of refraction and absorption indices of thin polymer film on the transparent semiconductor substrate via FTIR spectrometry
Peculiarities of registration of nonlinear photoanisotropy effects in noncollinear geometry of interacting waves