23 June 1995 M-line spectroscopy for nonlinear waveguide characterization
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Proceedings Volume 2208, Refractometry; (1995) https://doi.org/10.1117/12.213176
Event: Refractometry: International Conference, 1994, Warsaw, Poland
Abstract
The nonlinear M-line technique is based on the analysis of the nonlinear change in the shape of the dark line associated with the excitation of guided waves. It is an easy technique for the determination of Kerr properties of thin films which can constitute optical waveguides. Full spatio-temporal nonlinear modelization tools have been developed recently for nonlinear waveguide couplers which are used for the determination of the complex nonlinear coefficient of new organic materials.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guy Vitrant, Guy Vitrant, Raymond Reinisch, Raymond Reinisch, Francois Kajzar, Francois Kajzar, } "M-line spectroscopy for nonlinear waveguide characterization", Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213176; https://doi.org/10.1117/12.213176
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