23 June 1995 Multiple reflections in retardation plates with elliptical birefringence
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Proceedings Volume 2208, Refractometry; (1995) https://doi.org/10.1117/12.213191
Event: Refractometry: International Conference, 1994, Warsaw, Poland
The theory of elliptic retardation plates that takes into account a phenomenon of multiple reflections is presented. An analytical form of transition matrix for the normally incident plane wave is shown. Sample calculations of phase shift introduced by quartz retardation plates and of the output beam parameters as a function of plate thickness and optical axis orientation were done.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazimierz Pietraszkiewicz, Kazimierz Pietraszkiewicz, Wladyslaw Artur Wozniak, Wladyslaw Artur Wozniak, Piotr Kurzynowski, Piotr Kurzynowski, } "Multiple reflections in retardation plates with elliptical birefringence", Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213191; https://doi.org/10.1117/12.213191

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