30 September 1994 Far ultraviolet (FUV) optical constants of unoxidized aluminum films for application to coatings of in-orbit operating optical instruments
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Abstract
The far ultraviolet (FUV) reflectance of an unoxidized thin aluminum film, prepared and maintained under UHV conditions, was measured. Reflectance versus the angle of incidence was measured in two perpendicular planes of incidence. The complex refractive index of aluminum was obtained from those reflectance measurements, taking into account the scattering induced by the surface roughness. The results here shown allow the calculation of reflectance of aluminum coatings and multilayers containing aluminum for application in FUV optical instruments operating outside the atmosphere.
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Juan I. Larruquert, Juan I. Larruquert, Jose Antonio Mendez, Jose Antonio Mendez, Jose Antonio Aznarez, Jose Antonio Aznarez, "Far ultraviolet (FUV) optical constants of unoxidized aluminum films for application to coatings of in-orbit operating optical instruments", Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); doi: 10.1117/12.188134; https://doi.org/10.1117/12.188134
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