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30 September 1994 Microroughness, statistical surface models, and bidirectional reflection distribution function (BRDF): functions of smooth surfaces
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Abstract
The calculation of the BRDF (Bi-Directional-Reflection-Distribution-Function) from profile measurements was performed theoretically and verified by measurements on a BK7 sample. The assumptions on the surface topography and approximations done are highlighted.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Harnisch and Thomas Weigel "Microroughness, statistical surface models, and bidirectional reflection distribution function (BRDF): functions of smooth surfaces", Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); https://doi.org/10.1117/12.188111
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