28 July 1994 Characterization of microoptical elements by a stand-alone atomic-force microscope
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Proceedings Volume 2213, Nanofabrication Technologies and Device Integration; (1994); doi: 10.1117/12.180984
Event: Integrated Optoelectronics '94, 1994, Lindau, Germany
Abstract
The microfabrication of optical and micromechanical elements requires a high degree of accuracy in order to obtain the required efficiency in the functionality of the element. An easy, nondestructive 3D characterization of the batch fabricated elements after each fabrication step is needed to ensure a reliable engineering control over the whole process. We demonstrate the versatility of a stand-alone AFM which can be used as a flexible tool for the nondestructive characterization of all steps of a fabrication sequence of microfabricated optical and micromechanical elements without the necessity to specially prepare the samples under test.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Rgen Burger, Nicholas X. Randall, Rainer F. Christoph, Lei Yan, Olivier M. Parriaux, "Characterization of microoptical elements by a stand-alone atomic-force microscope", Proc. SPIE 2213, Nanofabrication Technologies and Device Integration, (28 July 1994); doi: 10.1117/12.180984; https://doi.org/10.1117/12.180984
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KEYWORDS
Diffraction gratings

Optical components

Microfabrication

Fresnel lenses

Atomic force microscopy

Diffraction

Diffractive optical elements

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