Use of the NIST-developed water calibrator for the Midcourse Space Experiment (MSX) mass spectrometer

O. Manuel Uy; Richard C. Benson; Mark T. Boies; James D. Kinnison; John S. Morgan; Stuart A. Tyson; Albert R. Filippelli; Charles R. Tilford

doi:10.1117/12.177673

8 June 1994 Use of the NIST-developed water calibrator for the Midcourse Space Experiment (MSX) mass spectrometer

O. Manuel Uy, Richard C. Benson, Mark T. Boies, James D. Kinnison, John S. Morgan, Stuart A. Tyson, Albert R. Filippelli, Charles R. Tilford

Author Affiliations +

Proceedings Volume 2214, Space Instrumentation and Dual-Use Technologies; (1994) https://doi.org/10.1117/12.177673
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The absolute measurement of low-density gases of interest in space experiments recently underwent a major advanced when the National Institute of Standards and Technology developed a primary standard for low-density water vapor. This standard, which features arrays of laser-drilled holes, was used to calibrate and characterize the performance of several vacuum instruments and the MSX neutral mass spectrometer. The neutral mass spectrometer will be used to measure the absolute densities of molecules outgassing from the MSX spacecraft during orbit and, thus, to validate the MSX contamination models and the effectiveness of the contamination control plan. The residual gas analyzers and the flight mass spectrometer were tested over a large range of partial pressures of H₂O, H₂He, N₂, O₂, and Ar. In certain cases, water vapor caused significant changes in the sensitivity of vacuum instruments and generated several other gaseous species.

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O. Manuel Uy, Richard C. Benson, Mark T. Boies, James D. Kinnison, John S. Morgan, Stuart A. Tyson, Albert R. Filippelli, and Charles R. Tilford "Use of the NIST-developed water calibrator for the Midcourse Space Experiment (MSX) mass spectrometer", Proc. SPIE 2214, Space Instrumentation and Dual-Use Technologies, (8 June 1994); https://doi.org/10.1117/12.177673

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