15 June 1994 Dynamic infrared projection analysis: an overview
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Abstract
In recent years there have been rapid developments in the field of dynamic infrared scene projection, driven principally by the demands for real-time hardware-in-the-loop simulation and by the fortuitously concurrent advances in large array silicon surface micromachining techniques and addressing/multiplexing scheme electronics. A diversity of techniques have been explored towards satisfying the infrared projection requirements, resulting in a need for development of systematic comparative assessment procedures. In this paper the current status of infrared projector analysis is reviewed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Owen M. Williams, "Dynamic infrared projection analysis: an overview", Proc. SPIE 2223, Characterization and Propagation of Sources and Backgrounds, (15 June 1994); doi: 10.1117/12.177906; https://doi.org/10.1117/12.177906
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KEYWORDS
Infrared radiation

Computer simulations

Electronics

Projection systems

Silicon

Surface micromachining

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