PROCEEDINGS VOLUME 2226
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL ENGINEERING AND PHOTONICS IN AEROSPACE SENSING | 4-8 APRIL 1994
Infrared Readout Electronics II
IN THIS VOLUME

3 Sessions, 25 Papers, 0 Presentations
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL ENGINEERING AND PHOTONICS IN AEROSPACE SENSING
4-8 April 1994
Orlando, FL, United States
Cryogenic Readout Technology
Proc. SPIE 2226, Issues in the readout of FIR- and millimeter-wave bolometers for astrophysical applications, 0000 (23 June 1994); doi: 10.1117/12.178470
Proc. SPIE 2226, Cryogenic GaAs JFETs, 0000 (23 June 1994); doi: 10.1117/12.178479
Proc. SPIE 2226, Progress on readout electronics for far-infrared arrays, 0000 (23 June 1994); doi: 10.1117/12.178487
Proc. SPIE 2226, Low-power high-resolution superconducting flux-quantizing A/D converter for IR array readout, 0000 (23 June 1994); doi: 10.1117/12.178490
Proc. SPIE 2226, Liquid-helium temperature operation of silicon-germanium heterojunction bipolar transistors, 0000 (23 June 1994); doi: 10.1117/12.178491
Proc. SPIE 2226, Laser diodes for optical readout of cryo-electronics, 0000 (23 June 1994); doi: 10.1117/12.178492
Proc. SPIE 2226, Advanced multiplexed readouts for T<15K focal plane arrays, 0000 (23 June 1994); doi: 10.1117/12.178493
Proc. SPIE 2226, One-micrometer, radiation-hardened complementary metal oxide semiconductor for cryogenic analog applications, 0000 (23 June 1994); doi: 10.1117/12.178494
Proc. SPIE 2226, 40K cryogenic rad-hard CMOS readout multiplexer fabrication process, 0000 (23 June 1994); doi: 10.1117/12.178471
MOSFET Readout Electronics
Proc. SPIE 2226, Hole trapping in MOSFET by hot carrier stressing and ionizing irradiation at 77K, 0000 (23 June 1994); doi: 10.1117/12.178472
Proc. SPIE 2226, Astronomical user requirements for IR array technology, 0000 (23 June 1994); doi: 10.1117/12.178473
Proc. SPIE 2226, Infrared readout electronics: a historical perspective, 0000 (23 June 1994); doi: 10.1117/12.178474
Proc. SPIE 2226, Direct injection readout circuit model, 0000 (23 June 1994); doi: 10.1117/12.178475
Proc. SPIE 2226, Buffered direct injection multiplexer for improved uniformity and yield in infrared cameras, 0000 (23 June 1994); doi: 10.1117/12.178476
Proc. SPIE 2226, Circuit design approaches for improved radiation hardness, 0000 (23 June 1994); doi: 10.1117/12.178477
Proc. SPIE 2226, Evaluation of the multiplexer for the Cassini visible and infrared mapping spectrometer focal plane array, 0000 (23 June 1994); doi: 10.1117/12.178478
Proc. SPIE 2226, Low-bias CTIA multiplexer for 1024-element InGaAs line sensors, 0000 (23 June 1994); doi: 10.1117/12.178480
Proc. SPIE 2226, Comparative study of linear multiplexer designs for a remote sensing application, 0000 (23 June 1994); doi: 10.1117/12.178481
FPA Signal Processing and CCD Readout
Proc. SPIE 2226, Ifrared focal plane array optical interface technology, 0000 (23 June 1994); doi: 10.1117/12.178482
Proc. SPIE 2226, Approaches and analysis for on-focal-plane analog-to-digital conversion, 0000 (23 June 1994); doi: 10.1117/12.178483
MOSFET Readout Electronics
Proc. SPIE 2226, Spiking oscillator networks for on-focal-plane image preprocessing, 0000 (23 June 1994); doi: 10.1117/12.178484
FPA Signal Processing and CCD Readout
Proc. SPIE 2226, Unique 3D architecture for high-resolution imaging, 0000 (23 June 1994); doi: 10.1117/12.178485
Proc. SPIE 2226, Low-noise CCD signal acquisition techniques, 0000 (23 June 1994); doi: 10.1117/12.178486
Proc. SPIE 2226, Functional variation of dual gate MOS-JFET CCD test structure, 0000 (23 June 1994); doi: 10.1117/12.178488
MOSFET Readout Electronics
Proc. SPIE 2226, Reliability of oxides at low temperatures, 0000 (23 June 1994); doi: 10.1117/12.178489
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