9 November 1994 Analog image detector in thin film on application-specific integrated circuit (ASIC) technology
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Proceedings Volume 2247, Sensors and Control for Automation; (1994) https://doi.org/10.1117/12.193939
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
The properties of thin film on ASIC image sensors are discussed starting from the dynamic range and linearity of the a-Si:H detector element. Depending on the operation mode, the dynamic range of the detector exceeds the performance of conventional CCDs by far. Limitations arising from a non optimized operation mode are examined employing a semi- empirical simulation model. They can be overcome with pixel electronics adapted to the demands of the detector. In order to maximize the dynamic range of the complete array, different modes of signal transport from the pixels to the peripheral circuitry are investigated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Helmut Fischer, Helmut Fischer, Tarek Lule, Tarek Lule, Bernd Schneider, Bernd Schneider, Juergen Schulte, Juergen Schulte, Markus Boehm, Markus Boehm, } "Analog image detector in thin film on application-specific integrated circuit (ASIC) technology", Proc. SPIE 2247, Sensors and Control for Automation, (9 November 1994); doi: 10.1117/12.193939; https://doi.org/10.1117/12.193939


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