Paper
15 November 1994 Calibration of projected fringe surface topography measurement systems
Catherine Wykes, R. Morshedizadeh, S. Ordish
Author Affiliations +
Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194359
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Abstract
Fringe projection methods have been widely discussed as a method of measuring surface form or topography. This paper discusses the factors which limit the accuracy of the technique and presents methods by which such a system can be calibrated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Catherine Wykes, R. Morshedizadeh, and S. Ordish "Calibration of projected fringe surface topography measurement systems", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194359
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Cited by 1 scholarly publication.
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KEYWORDS
Calibration

Phase measurement

Wavefronts

Cameras

Prototyping

Fringe analysis

Image processing

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