15 November 1994 Common-path holographic interferometer for flatness testing
Author Affiliations +
Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194311
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
An interferometer based on a single multi-functional holographic optical element (HOE) is presented. The interferometer is meant for flatness testing of quite large objects, not necessarily optically polished. Other features include two beam common-path arrangement, desensitization as compared to the classical (lambda) /2) figure, white-light illumination. Emphasis is then laid on automatic fringe pattern interpretation which makes use of an ad hoc phase-shifting procedure. Results obtained with computer disks are shown.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre M. Jacquot, Pierre M. Jacquot, Xavier Colonna de Lega, Xavier Colonna de Lega, Pierre Michel Boone, Pierre Michel Boone, "Common-path holographic interferometer for flatness testing", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194311; https://doi.org/10.1117/12.194311

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