15 November 1994 High sensitivity fringe projection micro-shape measurement system
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Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194316
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Abstract
The high sensitivity fringe projection automated system for shape measurement of the object with P-V ranging from 10 - 2000 micrometers is presented. The system uses the carrier-frequency phase-shifting fringe pattern analysis method which enables the proper shape determination on the basis of a single image. The system may be applied for the object with max. dimension up to 20 mm. The opto-mechanical arrangement uses white light and is not sensitive for vibrations and work in a hostile environment.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria Pirga, Maria Pirga, Malgorzata Kujawinska, Malgorzata Kujawinska, } "High sensitivity fringe projection micro-shape measurement system", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194316; https://doi.org/10.1117/12.194316
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