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15 November 1994 Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method
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Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194337
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Abstract
The mirror temperature of diode lasers has been measured by means of a photodeflection method. Information on the thermal behavior of the laser during operation is also obtained.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mario Bertolotti, G. L. Liakhou, Roberto Li Voti, Ruo Peng Wang, Concita Sibilia, and Vladimir P. Yacovlev "Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194337
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