15 November 1994 Monocular parameter estimation from intersections with planar surfaces
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Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194346
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Many industrial applications of optical metrology are confined to planar configurations. In this paper an approach to monocular parameter estimation is presented which makes use of this constraint. In addition to the components camera calibration and subpixel edge point detection, the method employs a recursive algorithm for parameter estimation. The algorithm and its application to simple contours such as lines and circles as well as to arbitrary implicitly given functions is described. The paper focuses on the contour segmentation that is reached using a fast plausibility test of the algorithm's residual sequence.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rolf Gerdes, Rolf Gerdes, } "Monocular parameter estimation from intersections with planar surfaces", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194346; https://doi.org/10.1117/12.194346


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