23 November 1994 Contour analysis algorithms for high-speed inspection
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Proceedings Volume 2249, Automated 3D and 2D Vision; (1994) https://doi.org/10.1117/12.196084
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Abstract
The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g. scale-space analysis) will be presented. The performance of different approaches is shown by several industrial examples and applications.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Knut Kille, "Contour analysis algorithms for high-speed inspection", Proc. SPIE 2249, Automated 3D and 2D Vision, (23 November 1994); doi: 10.1117/12.196084; https://doi.org/10.1117/12.196084
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