1 January 1994 Form effect and increase of mm detector sensitivity
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Proceedings Volume 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994; 22504J (1994) https://doi.org/10.1117/12.2303180
Event: Millimeter and Submillimeter Waves and Applications: International Conference, 1994, San Diego, CA, United States
Abstract
Form effect can cause the increase of sensitivity of ,171 detector based on ME wave inhomogeneous electron heating. The aforesaid takes place in detectors in which sensitive elemeats have tapered form. -,::eas- ured T 2 radiation has to fall on wide face of the detector and dark (aarrow) end is cooled up to the cryo7enic temperatures.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. I. Vakser, A. I. Vakser, } "Form effect and increase of mm detector sensitivity", Proc. SPIE 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994, 22504J (1 January 1994); doi: 10.1117/12.2303180; https://doi.org/10.1117/12.2303180
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