1 January 1994 Measurement of the surface impendance of superconducting thin films by a microstrip resonator technique
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Proceedings Volume 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994; 22504Z (1994) https://doi.org/10.1117/12.2303196
Event: Millimeter and Submillimeter Waves and Applications: International Conference, 1994, San Diego, CA, United States
Abstract
The surface impedance Zs of a superconductor is an important parameter for both basic science and technological applications. From a basic point of view, the study of Zs as a function of temperature, frequency and magnetic field may provide significant informations on the underlying mechanism of loss, on the simmetry of the ground state and on the dynamics of the r.f. absorption. From a technological point of view, Zs is a relevant figure of merit for the homogeneity of the material and for superconducting devices. We report here measurements of the temperature, frequency and input power dependence of the surface resistance and penetration depth of superconducting thin films using an annular microstrip resonator operating in the microwave region. The technique allows to measure surface resistance values as low as 1µS2 and penetration depth variations as small as 1 A.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Andreone, "Measurement of the surface impendance of superconducting thin films by a microstrip resonator technique", Proc. SPIE 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994, 22504Z (1 January 1994); doi: 10.1117/12.2303196; https://doi.org/10.1117/12.2303196
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