4 November 1994 Effects of near-surface transition layer on x-ray reflection and scattering
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Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192145
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
The influence of smooth (not step-like) variation of the dielectric function near a surface on reflectivity and scattering of X-rays is investigated theoretically. It is shown that the presence of the transition layer can essentially change the shape of differential scattering intensity diagram, especially when the incidence angle of X-ray beam is more than critical angle of the total external reflection. The application of model involved allows one to describe the Yoneda effect quantitatively (whereas it is impossible in the frames of a step-like model of the dielectric function).
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Igor A. Artioukov, Igor A. Artioukov, Igor V. Kozhevnikov, Igor V. Kozhevnikov, } "Effects of near-surface transition layer on x-ray reflection and scattering", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192145; https://doi.org/10.1117/12.192145
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