4 November 1994 Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers
Author Affiliations +
Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192070
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
It has been shown that a good interpretation of the absorption measurements performed from the photothermal deflection (PD) technique is given from a model including interface absorption. This model is applied to analyze the measurements of the losses on guided propagation, and a comparison with results obtained from PD technique is mae for various single-layer films. W show that the same parameters can explain satisfactorily both measurements. This study confirms the existence of absorbing transition layers close to the glass substrate and at the interfaces of the film.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre J. Roche, Pierre J. Roche, Mireille Commandre, Mireille Commandre, Ralf Mollenhauer, Ralf Mollenhauer, Francois Flory, Francois Flory, } "Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192070; https://doi.org/10.1117/12.192070
PROCEEDINGS
11 PAGES


SHARE
RELATED CONTENT

Transmission Properties Of Optical Fiber Waveguides
Proceedings of SPIE (November 05 1975)
Monolithically integrated InGaAsP/InP 1x2 SOA optical switch
Proceedings of SPIE (October 25 2007)
Loss anomalies in multilayer planar waveguides
Proceedings of SPIE (November 03 1994)
Optical and surface properties of oxyfluoride glass
Proceedings of SPIE (October 24 2000)
Properties of fused silica for 157-nm photomasks
Proceedings of SPIE (December 29 1999)

Back to Top