Loss anomalies in multilayer planar waveguides

Claude Amra; M. Ranier; Catherine Grezes-Besset; Sophie Maure; Frederic Cleva; Ralf Mollenhauer; Gerard Albrand

doi:10.1117/12.192179

4 November 1994 Loss anomalies in multilayer planar waveguides

Claude Amra, M. Ranier, Catherine Grezes-Besset, Sophie Maure, Frederic Cleva, Ralf Mollenhauer, Gerard Albrand

Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192179
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France

Abstract

An apparatus based on guided waves and photothermal techniques permits to measure attenuation coefficients in multilayer waveguides produced by I.A.D. and Ion Plating. Zero- order modes are used to obtain accurate values of extinction coefficients of T_iO₂ and Ta₂O₅ thin-film materials at wavelength 514.5 nm. On the other hand, higher-order modes reveal strong loss anomalies that are analyzed via electromagnetic theories of scattering and absorption, both including surface and bulk effects.

Citation Download Citation

Claude Amra, M. Ranier, Catherine Grezes-Besset, Sophie Maure, Frederic Cleva, Ralf Mollenhauer, and Gerard Albrand "Loss anomalies in multilayer planar waveguides", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192179

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