4 November 1994 Optical characterization of single and double layers with correlated randomly rough boundaries
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Proceedings Volume 2253, Optical Interference Coatings; (1994); doi: 10.1117/12.192097
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
Characterization of rough single and double layers is performed by interpreting spectral dependences of the coherent reflectance measured for these layers. Possibilities and limitations of the method are illustrated by means of several concrete samples of both the rough single and double layers represented by models corresponding to fully correlated (identical), partially correlated and fully uncorrelated boundaries.
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Ivan Ohlidal, Frantisek Vizd'a, "Optical characterization of single and double layers with correlated randomly rough boundaries", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192097; https://doi.org/10.1117/12.192097
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KEYWORDS
Reflectivity

Contrast transfer function

Gallium arsenide

Silicon

Thin films

Refractive index

Glasses

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