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9 September 1994 Optical properties and morphology of thin sputtered silver layers
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Proceedings Volume 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII; (1994) https://doi.org/10.1117/12.185395
Event: Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, 1994, Freiburg, Germany
Abstract
Thin silver layers are frequently used as the infrared reflecting component of low-e coatings. The optimum thickness of the layer must be found by maximizing the IR-reflectance and the visible transmittance. Since the optimum demands a very thin silver layer, the condensation and nucleation of the silver on the respective substrate or interface is very important. The subject of this study was the sputter deposition of silver on different substrate materials: float glass, tin oxide and bismuth oxide. The optical properties of the layers were measured spectroscopically from UV to IR. The topography of the layers was investigated by scanning force microscopy. The measurements exhibit significant differences depending on the substrate material.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lothar Herlitze, Rolf Blessing, Andreas Gombert, Wolfgang Graf, and Michael Koehl "Optical properties and morphology of thin sputtered silver layers", Proc. SPIE 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, (9 September 1994); https://doi.org/10.1117/12.185395
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