Translator Disclaimer
1 May 1994 New method for characterization of the space charge in insulators
Author Affiliations +
Proceedings Volume 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum; (1994) https://doi.org/10.1117/12.174675
Event: XVI International Symposium on Discharges and Electrical Insulation in Vacuum, 1994, Moscow-St. Petersburg, Russian Federation
Abstract
A new method called the `Mirroir Method' for characterization of charging properties of insulators is presented. This method consists in the characterization of electrical potential formed after irradiation of a sample with 30 kV electrons in a scanning electron microscope. Analytical and numerical calculations allows to relate the electrical potential with intrinsic properties of materials such as the dielectric constant. Experimental results on various materials are well fitted by the models. The role of contamination layers is underlined. Relation between charging and mechanical properties are described owing to friction experiments.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Vallayer, S. Fayeulle, C. Le Gressus, G. Blaise, and D. Treheux "New method for characterization of the space charge in insulators", Proc. SPIE 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum, (1 May 1994); https://doi.org/10.1117/12.174675
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top