PROCEEDINGS VOLUME 2260
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 24-29 JULY 1994
Stray Radiation in Optical Systems III
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
24-29 July 1994
San Diego, CA, United States
Stray Light Theory and Concepts
Proc. SPIE 2260, Status of data transfer without optical drawings and tables, 0000 (7 October 1994); doi: 10.1117/12.189202
Stray Light Analysis and Measurements
Proc. SPIE 2260, Selection of infrared black(s) for the Space Infra-Red Telescope Facility (SIRTF): a surface-by-surface performance comparison, 0000 (7 October 1994); doi: 10.1117/12.189213
Stray Light Theory and Concepts
Proc. SPIE 2260, Stray light performance optimization through system design, 0000 (7 October 1994); doi: 10.1117/12.189221
Proc. SPIE 2260, "Common" black baffle surfaces for telescopes and cryogenic infrared instruments, 0000 (7 October 1994); doi: 10.1117/12.189222
Stray Light Analysis and Measurements
Proc. SPIE 2260, Study of the impact of external straylight for the Michelson Interferometer for Passive Atmosphere Sounding (MIPAS), 0000 (7 October 1994); doi: 10.1117/12.189223
Stray Light Theory and Concepts
Proc. SPIE 2260, Atomic oxygen exposure effects module of the database for the properties of black, white, reflective, and transmissive spectrally selective surfaces, 0000 (7 October 1994); doi: 10.1117/12.189224
Proc. SPIE 2260, Measurement and analysis of scatter from rough surfaces, 0000 (7 October 1994); doi: 10.1117/12.189225
Stray Light Software and Hardware Tools
Proc. SPIE 2260, Instrumentation at the National Institue of Standards and Technology for bidirectional reflectance distribution function (BRDF) measurements, 0000 (7 October 1994); doi: 10.1117/12.189203
Proc. SPIE 2260, Extended performance infrared directional reflectometer for the measurement of total, diffuse, and specular reflectance, 0000 (7 October 1994); doi: 10.1117/12.189204
Proc. SPIE 2260, Accuracy and repeatability results of OMNISCATR: a high-speed high-resolution three-dimensional scatterometer, 0000 (7 October 1994); doi: 10.1117/12.189205
Proc. SPIE 2260, Bidirectional reflectance distribution function (BRDF) sensing with fiber optics, programmable laser diodes, and high-resolution CCD arrays, 0000 (7 October 1994); doi: 10.1117/12.189206
Proc. SPIE 2260, Inputting off-axis optical systems into APART for stray light analysis, 0000 (7 October 1994); doi: 10.1117/12.189207
Stray Light Analysis and Measurements
Proc. SPIE 2260, In-flight and post-flight stray radiation measurements on the Infrared Background Signature Survey (IBSS) telescope, 0000 (7 October 1994); doi: 10.1117/12.189208
Proc. SPIE 2260, Depolarization measurements of an integrating sphere, 0000 (7 October 1994); doi: 10.1117/12.189209
Proc. SPIE 2260, Enhanced backscattering from one-dimensional free-standing dielectric film, 0000 (7 October 1994); doi: 10.1117/12.189210
Bidirectional Reflectance Distribution Function (BRDF) Data
Proc. SPIE 2260, Polarization BRDF, 0000 (7 October 1994); doi: 10.1117/12.189211
Proc. SPIE 2260, Bidirectional reflectance distribution function (BRDF) measurements on the Whole Space Scatterometer (WSS), 0000 (7 October 1994); doi: 10.1117/12.189212
Proc. SPIE 2260, Review of black and reflective spectrally selective surfaces developed in the former USSR, 0000 (7 October 1994); doi: 10.1117/12.189214
Proc. SPIE 2260, Measurement and analysis of scatter from silicon wafers, 0000 (7 October 1994); doi: 10.1117/12.189215
Proc. SPIE 2260, Optical reflectance characterization of silicon micromachined surfaces, 0000 (7 October 1994); doi: 10.1117/12.189216
Proc. SPIE 2260, Unusual BRDF variations at specific infrared wavelengths, 0000 (7 October 1994); doi: 10.1117/12.189217
Proc. SPIE 2260, OMNISCATR: a high-speed high-resolution three-dimensional scatterometer measures complex scatter interference and diffraction patterns, 0000 (7 October 1994); doi: 10.1117/12.189218
Stray Light Analysis and Measurements
Proc. SPIE 2260, Interpretation of the backscattering phase matrix of cirrus clouds, 0000 (7 October 1994); doi: 10.1117/12.189219
Stray Light Software and Hardware Tools
Proc. SPIE 2260, Bidirectional Reflectance Analysis and Visualization Operations (BRAVO): a 3D visualization and processing tool for BRDF data, 0000 (7 October 1994); doi: 10.1117/12.189220
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