PROCEEDINGS VOLUME 2263
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 24-29 JULY 1994
Current Developments in Optical Design and Optical Engineering IV
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
24-29 July 1994
San Diego, CA, United States
Lens Design
Proc. SPIE 2263, Lens design using a minimum number of glasses, 0000 (30 September 1994); doi: 10.1117/12.187989
Proc. SPIE 2263, Optical design of a two-mirror asymmetrical reshaping system and its application in superbroadband color center lasers, 0000 (30 September 1994); doi: 10.1117/12.187996
Proc. SPIE 2263, Refractive indices of liquids in the infrared spectral region, 0000 (30 September 1994); doi: 10.1117/12.188006
Proc. SPIE 2263, Stability of the optical properties of abnormally dispersive liquids, 0000 (30 September 1994); doi: 10.1117/12.188015
Proc. SPIE 2263, Optical performance of axial gradient and aspheric surface lenses: study and analysis, 0000 (30 September 1994); doi: 10.1117/12.188031
Proc. SPIE 2263, Compact video-rate optical scanner (CVROS) for finite conjugate applications, 0000 (30 September 1994); doi: 10.1117/12.188032
Proc. SPIE 2263, Buchdahl dispersion model for gradient index glass families, 0000 (30 September 1994); doi: 10.1117/12.188033
Diffractive Optics, Gratings, and Optical Devices
Proc. SPIE 2263, Optical bistability on a thin-film Faraday rotator, 0000 (30 September 1994); doi: 10.1117/12.187990
Proc. SPIE 2263, Multilevel Fresnel zone lenses capable of being fabricated with only one binary mask, 0000 (30 September 1994); doi: 10.1117/12.187991
Proc. SPIE 2263, Computer-generated diffractive optical elements for optical interconnections: design and validation codes, 0000 (30 September 1994); doi: 10.1117/12.187992
Proc. SPIE 2263, Nonphotolithographic fabrication of large computer-generated diffractive optical elements, 0000 (30 September 1994); doi: 10.1117/12.187993
Proc. SPIE 2263, Exact numerical solution of Helmholtz's equation in dielectric gratings with arbitrary profiles, 0000 (30 September 1994); doi: 10.1117/12.187994
Proc. SPIE 2263, Fabrication and characterization of pure silica Fresnel lenses, 0000 (30 September 1994); doi: 10.1117/12.187995
Optical System Fabrication and Testing I
Proc. SPIE 2263, Fabrication of aspheric cylindrical microlenses with the diamond turning technology, 0000 (30 September 1994); doi: 10.1117/12.187997
Proc. SPIE 2263, Development of an ion figuring system for centimeter scale optical components, 0000 (30 September 1994); doi: 10.1117/12.187998
Proc. SPIE 2263, Integrated ion beam milling and coating for precision optical fabrication, 0000 (30 September 1994); doi: 10.1117/12.187999
Proc. SPIE 2263, Wavefront estimate from wavefront slope measurement by comparing their Zernike polynomials fitting coefficients, 0000 (30 September 1994); doi: 10.1117/12.188000
Proc. SPIE 2263, Principal surface approach as means of precise RMS-roughness estimation in noncontact profilometry, 0000 (30 September 1994); doi: 10.1117/12.188001
Proc. SPIE 2263, Null testing of an f/0.6 concave aspheric surface, 0000 (30 September 1994); doi: 10.1117/12.188002
Proc. SPIE 2263, Alignment sensitivities of the conjugate null test, 0000 (30 September 1994); doi: 10.1117/12.188003
Proc. SPIE 2263, Discussion of techniques that separate orthogonal data produced by Ronchi cross grating patterns, 0000 (30 September 1994); doi: 10.1117/12.188004
Proc. SPIE 2263, Status of the Advanced X-Ray Astrophysics Facility (AXAF) optics production program, 0000 (30 September 1994); doi: 10.1117/12.188005
Proc. SPIE 2263, Comparison of metrology methods for large astronomical secondary mirrors, 0000 (30 September 1994); doi: 10.1117/12.188007
Optical System Fabrication and Testing II
Proc. SPIE 2263, Optical measurement for satellite profilometer surface using spread spectrum techniques, 0000 (30 September 1994); doi: 10.1117/12.188008
Lens Design
Proc. SPIE 2263, Optical systems design for focal plane testing using direct write scene generation, 0000 (30 September 1994); doi: 10.1117/12.188009
Optical System Fabrication and Testing II
Proc. SPIE 2263, Nondestructive evaluation of an epoxy-based coating by optical interferometry techniques, 0000 (30 September 1994); doi: 10.1117/12.188010
Proc. SPIE 2263, Phase specklegram: a significant improvement of laser-speckle photography, 0000 (30 September 1994); doi: 10.1117/12.188011
Proc. SPIE 2263, Holographic interferometry applied to the analysis of active complex compliant structures, 0000 (30 September 1994); doi: 10.1117/12.188012
Proc. SPIE 2263, Rigorous and accurate method for measuring the spatial resolution of two-dimensional image sensors, 0000 (30 September 1994); doi: 10.1117/12.188013
Proc. SPIE 2263, Method to analyze optical waveguides with arbitrary index profiles, 0000 (30 September 1994); doi: 10.1117/12.188014
Optical Engineering
Proc. SPIE 2263, Estimation of mounting-induced axial contact stresses in multielement lens assemblies, 0000 (30 September 1994); doi: 10.1117/12.188016
Proc. SPIE 2263, Family of fiber based confocal and quasi-confocal microprobes, 0000 (30 September 1994); doi: 10.1117/12.188017
Proc. SPIE 2263, Electromagnetic driven liquid mirrors, 0000 (30 September 1994); doi: 10.1117/12.188018
Proc. SPIE 2263, Location of mechanical features in lens mounts, 0000 (30 September 1994); doi: 10.1117/12.188019
Proc. SPIE 2263, One-bit correlator concept for high-resolution speckle imaging, 0000 (30 September 1994); doi: 10.1117/12.188020
Proc. SPIE 2263, New-type of pseudorandom position optical encoder with submicrometer resolution: design and characterization, 0000 (30 September 1994); doi: 10.1117/12.188021
Proc. SPIE 2263, Tolerance analysis versus image quality: a case study for cost-effective space optics, 0000 (30 September 1994); doi: 10.1117/12.188022
Proc. SPIE 2263, Use of a liquid crystal switch in single-lens-reflex camera, 0000 (30 September 1994); doi: 10.1117/12.188023
Proc. SPIE 2263, Theoretical analysis of the LP mode in e-core fiber, 0000 (30 September 1994); doi: 10.1117/12.188024
Optical System Fabrication and Testing I
Proc. SPIE 2263, High-precision mechanical profilometer for grazing incidence optics, 0000 (30 September 1994); doi: 10.1117/12.188025
Optical Engineering
Proc. SPIE 2263, Derivation of structural influence coefficients for long-focus imaging optical systems, 0000 (30 September 1994); doi: 10.1117/12.188026
Optical System Fabrication and Testing I
Proc. SPIE 2263, Long-term and thermal instability of carbon/carbon composite, 0000 (30 September 1994); doi: 10.1117/12.188027
Lens Design
Proc. SPIE 2263, Achromatic aberration corrections with only one glass, 0000 (30 September 1994); doi: 10.1117/12.188028
Optical System Fabrication and Testing II
Proc. SPIE 2263, Limit to the degree of asphericity when testing wavefronts using digital interferometry, 0000 (30 September 1994); doi: 10.1117/12.188029
Proc. SPIE 2263, Talbot imaging with magnification, 0000 (30 September 1994); doi: 10.1117/12.188030
Back to Top