Rigorous and accurate method for measuring the spatial resolution of two-dimensional image sensors

Herve Blanc; Jean Glasser

doi:10.1117/12.188013

30 September 1994 Rigorous and accurate method for measuring the spatial resolution of two-dimensional image sensors

Herve Blanc, Jean Glasser

Proceedings Volume 2263, Current Developments in Optical Design and Optical Engineering IV; (1994) https://doi.org/10.1117/12.188013
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Characterizing two-dimensional image sensors is not accurate enough when using one- dimensional methods. The response of a photoelement may be fully characterized by the function of two space variables (Photoelement Response Function). A simple and rigorous method was developed to measure this function, using a new two-dimensional pattern and a differential operator. The first results are indeed not complete, but there is no doubt about the interest of this method. Two patents have already been taken out.

Citation Download Citation

Herve Blanc and Jean Glasser "Rigorous and accurate method for measuring the spatial resolution of two-dimensional image sensors", Proc. SPIE 2263, Current Developments in Optical Design and Optical Engineering IV, (30 September 1994); https://doi.org/10.1117/12.188013

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