Visit My Account to manage your email alerts.
Comparison of state-of-the-art methods for defining and specifying damping qualities of optical tables
Methods of developing vibration and acoustic noise specifications for microelectronics process tools
Conceptual design of new metrology laboratories for the National Physical Laboratory, United Kingdom
Investigation of dynamic soil-structure interaction as it relates to the design of foundation systems for microelectronics fabrication facilities
High-sensitivity adaptive vibration measurements with nonsteady-state photo-EMF-based photodetectors