New method for the determination of the G factor for a spectrophotofluorometer

Edward Collett; Enrique Homar

doi:10.1117/12.186654

14 September 1994 New method for the determination of the G factor for a spectrophotofluorometer

Edward Collett, Enrique Homar

Proceedings Volume 2265, Polarization Analysis and Measurement II; (1994) https://doi.org/10.1117/12.186654
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

In modem spectrophotofluorometers diffraction gratings are used to select the excitation and emission wavelengths of fluorescent solutions, respectively. Diffraction gratings, however, are polarization sensitive. In a spectrophotofluorometer the polarization contribution ofthe emission diffraction grating (known as the grating or G factor) must be known. In this paper an analysis of the measurement of the G factor is made using the formalism of the Stokes polarization parameters and the Mueller matrix calculus. The analysis shows that the current method for determining the spectral polarization behavior of the emission diffraction grating (the G factor) assumes the optical source in the cuvette chamber, e.g., a tungsten lamp or a fluorescent solution is unpolarized. In practice, these sources are usually partially polarized. Consequently, for this and other reasons we have developed a new method for obtaining G using a right angle prism placed in the cuvette chamber of the spectrophotofluorometer. The right angle prism has the unique property that it behaves as a perfect retarder and when incident polarized light is reflected from the diagonal surface of the prism the Stokes parameter s is zero. By setting the incident polarizer to +45and then setting the analyzer to the horizontal and vertical directions, respectively, the correct G factor can be determined. In the final part of the paper we describe the

Citation Download Citation

Edward Collett and Enrique Homar "New method for the determination of the G factor for a spectrophotofluorometer", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); https://doi.org/10.1117/12.186654

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
10 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Polarization

Diffraction gratings

Luminescence

Prisms

Polarizers

Sensors

Rhodamine B

Show All Keywords

Keywords/Phrases

Search In:

Publication Years