Periodic and quasiperiodic nonquarterwave multilayer coating for 90-deg reflection phase retardance at 45-deg angle of incidence

Mostofa M. K. Howlader; Rasheed M. A. Azzam

doi:10.1117/12.186656

14 September 1994 Periodic and quasiperiodic nonquarterwave multilayer coating for 90° reflection phase retardance at 45° angle of incidence

Mostofa M. K. Howlader, Rasheed M. A. Azzam

Author Affiliations +

Proceedings Volume 2265, Polarization Analysis and Measurement II; (1994) https://doi.org/10.1117/12.186656
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

All possible solutions for a periodic stack of 10 ZnS-ThF₄ bilayers on a Ag substrate that produce 90 degree(s) differential reflection phase shift at 45 degree(s) angle of incidence and 3.39- micrometers wavelength are determined. The angular and wavelength sensitivity of several of these designs is considered. To increase the reflectance, reduce the diattenuation, and improve the sensitivity of the 20-layer reflection quarter-wave retarder (QWR), we also consider quasiperiodic stacks. These designs are obtained by iteration starting from an initial high- reflectance 10-bilayer, non-QWR, periodic structure and adjusting the thicknesses of the two films of the topmost bilayer to realize the desired 90 degree(s) retardance. Again multiple solutions are obtained for each initial design and their angular and wavelength sensitivity are analyzed. It is found that the best sensitivity corresponds to the lowest and nearly equal optical thicknesses of the two films of the topmost bilayer. Performance comparable to that reported in the literature, obtained for more complicated stacks in which the thicknesses of all 20 films are different, are reported.

Citation Download Citation

Mostofa M. K. Howlader and Rasheed M. A. Azzam "Periodic and quasiperiodic nonquarterwave multilayer coating for 90° reflection phase retardance at 45° angle of incidence", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); https://doi.org/10.1117/12.186656

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
13 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Phase shifts

Reflection

Reflectivity

Multilayers

Silver

Wave plates

Absorption

Show All Keywords

Keywords/Phrases

Search In:

Publication Years