14 September 1994 Polarization errors associated with birefringent waveplates
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Abstract
Although zero-order quartz waveplates are widely used in instrumentation that needs good temperature and field-of-view characteristics, the residual errors associated with these devices can be very important in high resolution polarimetry measurements. This paper will discuss how the field-of-view characteristics are affected by retardation errors and the misalignment of optic axes in a double crystal waveplate. The paper will then describe the retardation measurements that were made on zero-order quartz and single-order `achromatic' waveplates and how the misalignment errors affect those measurements.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward A. West, Edward A. West, Matthew H. Smith, Matthew H. Smith, } "Polarization errors associated with birefringent waveplates", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186698; https://doi.org/10.1117/12.186698
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