Advanced computed tomography inspection system (ACTIS): an overview of the technology and its applications

Ronald D. Beshears; Lisa H. Hediger

doi:10.1117/12.188822

4 October 1994 Advanced computed tomography inspection system (ACTIS): an overview of the technology and its applications

Ronald D. Beshears, Lisa H. Hediger

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Proceedings Volume 2270, NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications; (1994) https://doi.org/10.1117/12.188822
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

The Advanced Computed Tomography Inspection System (ACTIS) was developed by the Marshall Space Flight Center to support in-house solid propulsion test programs. ACTIS represents a significant advance in state-of-the-art inspection systems. Its flexibility and superior technical performance have made ACTIS very popular, both within and outside the aerospace community. Through Technology Utilization efforts, ACTIS has been applied to inspection problems in commercial aerospace, lumber, automotive, and nuclear waste disposal industries. ACTIS has even been used to inspect items of historical interest. ACTIS has consistently produced valuable results, providing information which was unattainable through conventional inspection methods. Although many successes have already been demonstrated, the full potential of ACTIS has not yet been realized. It is currently being applied in the commercial aerospace industry by Boeing Aerospace Company. Smaller systems, based on ACTIS technology are becoming increasingly available. This technology has much to offer small businesses and industry, especially in identifying design and process problems early in the product development cycle to prevent defects. Several options are available to businesses interested in pursuing this technology.

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Ronald D. Beshears and Lisa H. Hediger "Advanced computed tomography inspection system (ACTIS): an overview of the technology and its applications", Proc. SPIE 2270, NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications, (4 October 1994); https://doi.org/10.1117/12.188822

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KEYWORDS

Inspection

Computed tomography

Computing systems

Aerospace engineering

X-rays

Sensors

Visualization

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