7 October 1994 n and k measurement of MCT and PST by polarized reflectometry
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Abstract
In this paper, the measurement results of n and k of MCT and PST by polarized reflectometry are reported. The results show that in the infrared spectrum region the polarized reflectometry is also an effective method for measurements of n and k.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fei-Fei Wu, Wenzhen Song, Hui-Fen Yu, Runqing Jiang, Xiangyang Li, Zhaopeng Liu, "n and k measurement of MCT and PST by polarized reflectometry", Proc. SPIE 2274, Infrared Detectors: State of the Art II, (7 October 1994); doi: 10.1117/12.189229; https://doi.org/10.1117/12.189229
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KEYWORDS
Infrared radiation

Reflectivity

Reflectometry

Mercury cadmium telluride

Refractive index

Infrared detectors

Semiconductors

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