7 October 1994 Properties of the HgCdTe films
Author Affiliations +
Abstract
The HgCdTe films had been made by vacuum evaporation. If the substrate temperature is about at 100 degree(s)C, the size of the crystallite of the HgCdTe films is about 0.1 micrometers , the size decrease with the substrate temperature decreasing in the range down to about 50 degree(s)C. We had been measured the optical and electrical properties of HgCdTe films, the conductivity is about (0.1 - 1) (Omega) -1(DOT)cm-1 at 300 degree(s)C for polycrystal samples, and the conductivity decrease with the temperature decreasing, the optical gap for one typical sample is about 0.8 eV calculated from the optical absorption edge, the refraction and attenuation index are measured by ellipsometry and the dispersion curves are obtained.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fei-Fei Wu, Wenzhen Song, Runqing Jiang, Jingxuan Yan, Zhaopeng Liu, "Properties of the HgCdTe films", Proc. SPIE 2274, Infrared Detectors: State of the Art II, (7 October 1994); doi: 10.1117/12.189228; https://doi.org/10.1117/12.189228
PROCEEDINGS
5 PAGES


SHARE
Back to Top