High-frequency characterization of dielectrics using open resonators

Dariush Mirshekar-Syahkal

doi:10.1117/12.186732

14 September 1994 High-frequency characterization of dielectrics using open resonators

Dariush Mirshekar-Syahkal

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186732
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Open planar resonators like rectangular and triangular microstrip resonators and slot resonators can be used to determine the dielectric constants of lossy or lossless dielectrics at microwave and millimeter-wave frequencies. These resonators can also be used to measure the thickness of dielectric slabs. In all cases, the accuracy of the method depends on the theoretical information available for the inversion of the measured data. In this paper, a general accurate pseudo-numerical technique for the analysis of single and multi-layer open planar resonators loaded with dielectric slabs is given. The technique can be used to obtain inversion curves. In the case of the microstrip resonator, coupling to the signal source is assumed to be through a coaxial probe or through a microstrip line, whereas in the case of the slot resonator, a microstrip line feeds the resonator. The technique is applied to specific cases of single and double layer microstrip resonators of rectangular and triangular shape in order to compute the shifts in the resonant frequency and changes in the input impedance when these resonators are subjected to various lossy and lossless dielectric materials of different thicknesses. Sample results are presented and discussed. In particular, it is shown that the double layer resonator offers some advantages in the measurement of the shift of the resonant frequency as one of their two resonant frequencies (i.e., the upper resonant frequency) seems to be almost independent of the dielectric loading, and hence can be used as the frequency reference.

Citation Download Citation

Dariush Mirshekar-Syahkal "High-frequency characterization of dielectrics using open resonators", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186732

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