Low-temperature scanning electron microscopy of niobium superconducting tunnel junctions with trapping blocks

P. H. Videler; Nicola Rando; Peter Verhoeve; Anthony J. Peacock; S. Lemke; J. Martin; R. Gross; R. Huebener; John M. Lumley

doi:10.1117/12.186833

16 September 1994 Low-temperature scanning electron microscopy of niobium superconducting tunnel junctions with trapping blocks

P. H. Videler, Nicola Rando, Peter Verhoeve, Anthony J. Peacock, S. Lemke, J. Martin, R. Gross, R. Huebener, John M. Lumley

Author Affiliations +

Proceedings Volume 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V; (1994) https://doi.org/10.1117/12.186833
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

In this paper we investigate the QP transport and loss mechanisms in a superconducting tunnel junction using the Low Temperature Scanning Electron Microscopy (LTSEM) technique. This approach allows precise control of the energy and position of a deposited electron pulse, which, within certain conditions, simulates the X-ray photo-absorption process. An Nb-Al-AlO_xNb junction designed as a test structure which included Al blocks in the leads to act as quasiparticle traps, has been investigated. Asymmetries in the LTSEM signal distribution can be qualitatively described from the device geometry. From both the spatial distribution can be qualitatively described from the device geometry. From both the spatial distribution and the time resolved measurements the diffusion length in the amorphous Nb was determined to be of the order of 8 micrometers . The LTSEM technique has demonstrated that quasiparticles produced in the leads cannot enter the tunnel barrier due to the presence of the Al traps.

Citation Download Citation

P. H. Videler, Nicola Rando, Peter Verhoeve, Anthony J. Peacock, S. Lemke, J. Martin, R. Gross, R. Huebener, and John M. Lumley "Low-temperature scanning electron microscopy of niobium superconducting tunnel junctions with trapping blocks", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186833

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available