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16 September 1994 Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors
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Abstract
We describe our recent synchrotron measurements of microchannel plate (MCP) quantum detection efficiency made in pulse-counting mode in a 40-300 eV band containing the L shell absorption edges of silicon. The significance of this data for the calibration of the HRC-S transmission grating detector for the AXAF-I X-ray observatory is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
George W. Fraser, John Ernest Lees, James F. Pearson, Anthony P. Nichols, and P. Bailey "Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186803
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