Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer

Todd A. Decker; Richard C. Montesanti; Jay V. Bixler; Charles J. Hailey; Steven M. Kahn

doi:10.1117/12.193208

7 November 1994 Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer

Todd A. Decker, Richard C. Montesanti, Jay V. Bixler, Charles J. Hailey, Steven M. Kahn

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Proceedings Volume 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry; (1994) https://doi.org/10.1117/12.193208
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 micrometers in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry.

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Todd A. Decker, Richard C. Montesanti, Jay V. Bixler, Charles J. Hailey, and Steven M. Kahn "Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193208

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