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7 November 1994 Prospects for supermirrors in hard x-ray spectroscopy
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Abstract
Supermirrors are multilayer structures where the thickness of the layers down through the structure changes so that wide-band reflection occurs. The principles were developed in the mid-70s and have been used extensively for neutron optics. Absorption in the upper layers limits the attainable reflectivity for x rays. For hard x rays (>= 15 keV), the absorption, however, is low enough that it is possible to design supermirrors with 10 - 70% reflectivity in a band approximately equals 3 times the width of the total reflection regime. Supermirrors of W/Si and Ni/C have been successfully fabricated and characterized. The measured x-ray reflectivities are well accounted for by the standard dynamical theories of multilayer reflection. Hard x ray applications that could benefit from x-ray supermirror coatings include focusing and imaging instrumentation for astrophysics, collimating and focusing devices for synchrotron radiation, and particle filtering in plasma diagnostics.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karsten Dan Joensen, Paul Gorenstein, Finn Erland Christensen, Peter Hoghoj, Eric Ziegler, Jean Susini, Andreas K. Freund, D. Peter Siddons, and James L. Wood "Prospects for supermirrors in hard x-ray spectroscopy", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193181
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