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7 November 1994 X-ray tomographic spectroscopy: TOMOSCOP low-energy design concept
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Abstract
Chemical elements are characterized by the nature of the interaction between their electrons and incoming photons. The uniqueness of a spectral signature of each chemical element is used in spectroscopy for element detection and characterization. We report the design of the detection and chemical composition analysis system, TOMOSCOP, which is based on tomographic spectroscopic imaging at x-ray energies within the 15 - 30 keV range. The detection of the presence of an element or a group of elements and measurements of their concentration in a sample are based on calibration attenuation measurements conducted on known samples. The TOMOSCOP system utilizes x-ray filter spectroscopy for positive identification and concentration measurement of an element within a sample. Tomography combined with spectroscopy provides the unique detection capability of the TOMOSCOP system in which elements and compounds (substances) present within the test volume are localized and detected.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Muamer Zukic, Michele Wilson McColgan, Douglas G. Torr, Alphonsus John Fennelly, and Edward L. Fry "X-ray tomographic spectroscopy: TOMOSCOP low-energy design concept", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193189
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