Near-field measurements of optical channel waveguide structures

Ahn Goo Choo; Howard E. Jackson; U. Thiel; Gregory N. De Brabander; Joseph T. Boyd

doi:10.1117/12.190932

21 October 1994 Near-field measurements of optical channel waveguide structures

Ahn Goo Choo, Howard E. Jackson, U. Thiel, Gregory N. De Brabander, Joseph T. Boyd

Proceedings Volume 2291, Integrated Optics and Microstructures II; (1994) https://doi.org/10.1117/12.190932
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Near field scanning optical microscopy (NSOM) has been used to investigate the guided mode intensity distribution in optical channel waveguides, phase-matched directional couplers, and symmetric Y- junctions. A near field measurement of the lateral guided mode intensity profile was performed across the optical channel waveguide, and compared with model calculations. The near field guided mode intensity profiles above the waveguides were measured as a function of distance along both a directional coupler and a Y-junction, providing a near field view of the spatial evolution of optical power in these structures.

Citation Download Citation

Ahn Goo Choo, Howard E. Jackson, U. Thiel, Gregory N. De Brabander, and Joseph T. Boyd "Near-field measurements of optical channel waveguide structures", Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); https://doi.org/10.1117/12.190932

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