21 October 1994 Near-field measurements of optical channel waveguide structures
Author Affiliations +
Abstract
Near field scanning optical microscopy (NSOM) has been used to investigate the guided mode intensity distribution in optical channel waveguides, phase-matched directional couplers, and symmetric Y- junctions. A near field measurement of the lateral guided mode intensity profile was performed across the optical channel waveguide, and compared with model calculations. The near field guided mode intensity profiles above the waveguides were measured as a function of distance along both a directional coupler and a Y-junction, providing a near field view of the spatial evolution of optical power in these structures.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahn Goo Choo, Howard E. Jackson, U. Thiel, Gregory N. De Brabander, Joseph T. Boyd, "Near-field measurements of optical channel waveguide structures", Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); doi: 10.1117/12.190932; https://doi.org/10.1117/12.190932
PROCEEDINGS
6 PAGES


SHARE
Back to Top