21 October 1994 Near-field measurements of optical channel waveguide structures
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Near field scanning optical microscopy (NSOM) has been used to investigate the guided mode intensity distribution in optical channel waveguides, phase-matched directional couplers, and symmetric Y- junctions. A near field measurement of the lateral guided mode intensity profile was performed across the optical channel waveguide, and compared with model calculations. The near field guided mode intensity profiles above the waveguides were measured as a function of distance along both a directional coupler and a Y-junction, providing a near field view of the spatial evolution of optical power in these structures.
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Ahn Goo Choo, Ahn Goo Choo, Howard E. Jackson, Howard E. Jackson, U. Thiel, U. Thiel, Gregory N. De Brabander, Gregory N. De Brabander, Joseph T. Boyd, Joseph T. Boyd, "Near-field measurements of optical channel waveguide structures", Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); doi: 10.1117/12.190932; https://doi.org/10.1117/12.190932

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