Effects of film roughness on surface plasmon resonance sensors: finite-difference time-domain (FDTD) modeling

Douglas A. Christensen; David Fowers

doi:10.1117/12.190974

21 October 1994 Effects of film roughness on surface plasmon resonance sensors: finite-difference time-domain (FDTD) modeling

Douglas A. Christensen, David Fowers

Author Affiliations +

Proceedings Volume 2293, Chemical, Biochemical, and Environmental Fiber Sensors VI; (1994) https://doi.org/10.1117/12.190974
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Surface plasmon resonance forms the basis for several kinds of optical sensors, including immunoassays in which a local change in refractive index due to antigen binding causes a shift in the angle of minimum reflectivity from a thin metal film. Two factors will broaden the reflectivity curve: the finite size of the incident beam and any irregularities in the thickness of the metal film. In this paper, we estimate the extent of broadening due to finite beam width by using an angular spectrum approach, and we employ the numerical electromagnetic technique of finite-difference time-domain (FDTD) to analyze the effects of film roughness. It is seen that film irregularities lead to distinct changes in the reflectivity curve and to enhancement of the local electric fields at the surface of the film.

Citation Download Citation

Douglas A. Christensen and David Fowers "Effects of film roughness on surface plasmon resonance sensors: finite-difference time-domain (FDTD) modeling", Proc. SPIE 2293, Chemical, Biochemical, and Environmental Fiber Sensors VI, (21 October 1994); https://doi.org/10.1117/12.190974

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