Optical Based,Microprocessor Controlled, Stack Particulate Monitor

A. L. Wertheimer; G. J. Pfisterer Jr.

doi:10.1117/12.958820

8 August 1980 Optical Based,Microprocessor Controlled, Stack Particulate Monitor

A. L. Wertheimer, G. J. Pfisterer Jr.

Proceedings Volume 0230, Minicomputers and Microprocessors in Optical Systems; (1980) https://doi.org/10.1117/12.958820
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States

Abstract

An instrument has been constructed for real time measurement of particle size in the range of 0.2 to 20 microns in diameter. This unit is designed for use in industrial stationary sources, and employs a helium neon laser source and two modes of light scattering, low angle forward scattering and polarization dependent, 90° scattering. A Z80 micro-processor provides control of the measurement functions. These include control of the synchronization and multiplexing of eight separate detectors, computation of a particle size histogram from the raw data, and control of the data printout through an alpha-numeric printer.

Citation Download Citation

A. L. Wertheimer and G. J. Pfisterer Jr. "Optical Based,Microprocessor Controlled, Stack Particulate Monitor", Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); https://doi.org/10.1117/12.958820

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